Mixed signal LSI test system
【Target devices】Automotive, Power supply, Battery management, Each drivers, etc
Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system. This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.
【WL27/WL27H】
Specifications highlight
| Detection | |
|---|---|
| Test Rate: | 20/40 MHz |
| Digital Pins: | 256 pins、256 PPS (WL27H) |
| 128 pins、128 PPS (WL27) | |
| DSP Module AFG: | 16 bits/10 Msps |
| DSP Module ADGT: | 16 bits/10 Msps |
| DSP Module VFG: | 14 bits/240 Msps |
| DSP Module VDGT: | 14 bits/80 Msps |
| High Power V/I: | ±60 V/±10 A mountable |
WL27Prime Mixed Signal LSI Test-System
Our New product WL27Prime make it possible to testing various products which is Power-Mixed IC build in MCU, LSI with 100MHz and other.
【WL27Prime】
Characteristic
- Providing I/O Digital as Maximum1024ch
- Parallel Test : Maximum 128 DUT
- Mounting Multi-Patter Generator, SCAN and ALPG
- Providing PMU, TMU function as Per-pin
- Customer can choose various modules for WL25 series on WL27Prime.
- Power device testing can be possible by High-Current, High-Voltage option.
Specification
- 100MHz 1024 I/O Digital
- 64V/1.5A
- 16V/100A
- 2000V/100mA
