Semiconductor test system

Power mixed test system

【Target Devices】 Automotive IPD/IPM etc

Power device or module with which are digitally controlled and memory can be measured per system.

【WL25MXL】

   
 
Specifications highlight (Test items)
  • Capable of parallel testing
  • Analog pin 64V/1.5A  192CH
  • Digital pin 50MHz    64CH
  • Hi voltage V/I   2000V/20mA
  • Hi current V/I 60V/10A,30V/30A,16V/100A
  • Time、DSP(Audio/Video)
【WL25MXS】

   
 
Specifications highlight (Test items)
  • Capable of parallel testing
  • Analog pin 64V/1.5A  128CH
  • Digital pin 50MHz    64CH
  • Built-in modules
  • Hi voltage V/I   2000V/20mA
  • Hi current V/I   60V/10A,30V/30A
  • Time、DSP(Audio/Video)
Top
-->